This edition had all images removed.
LoC No.: 20010063
Title: Condensed guide for the Stanford revision of the Binet-Simon intelligence tests
Credits: Produced by Ron Swanson
Summary: "Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests" by Lewis M. Terman is a scientific publication written in the early 20th century. The book serves as a practical handbook for the administration of the Stanford Revision of the Binet-Simon intelligence tests, aiming to streamline the application of these assessments while providing guidelines for effective testing practices. In this concise guide, Terman emphasizes the importance of a solid understanding of the original testing procedures and the psychological principles underlying them. It includes detailed instructions for each test, along with tips for effective examination techniques. Furthermore, the guide discusses common mistakes to avoid and provides essential commands that are fundamental to conducting the tests accurately. This resource is particularly beneficial for experienced examiners looking for a supplementary tool to facilitate their work while ensuring that the integrity of the testing process is maintained. (This is an automatically generated summary.)
Reading Level: Reading ease score: 83.2 (6th grade). Easy to read.
Author: Terman, Lewis M. (Lewis Madison), 1877-1956
EBook No.: 34307
Published: Nov 13, 2010
Downloads: 207
Language: English
Subject: Intelligence tests
Subject: Stanford-Binet Test
Subject: Binet-Simon Test
LoCC: Education: Theory and practice of education
Category: Text
Rights: Public domain in the USA.
This edition has images.
LoC No.: 20010063
Title: Condensed guide for the Stanford revision of the Binet-Simon intelligence tests
Credits: Produced by Ron Swanson
Summary: "Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests" by Lewis M. Terman is a scientific publication written in the early 20th century. The book serves as a practical handbook for the administration of the Stanford Revision of the Binet-Simon intelligence tests, aiming to streamline the application of these assessments while providing guidelines for effective testing practices. In this concise guide, Terman emphasizes the importance of a solid understanding of the original testing procedures and the psychological principles underlying them. It includes detailed instructions for each test, along with tips for effective examination techniques. Furthermore, the guide discusses common mistakes to avoid and provides essential commands that are fundamental to conducting the tests accurately. This resource is particularly beneficial for experienced examiners looking for a supplementary tool to facilitate their work while ensuring that the integrity of the testing process is maintained. (This is an automatically generated summary.)
Reading Level: Reading ease score: 83.2 (6th grade). Easy to read.
Author: Terman, Lewis M. (Lewis Madison), 1877-1956
EBook No.: 34307
Published: Nov 13, 2010
Downloads: 207
Language: English
Subject: Intelligence tests
Subject: Stanford-Binet Test
Subject: Binet-Simon Test
LoCC: Education: Theory and practice of education
Category: Text
Rights: Public domain in the USA.